Scanning NV Magnetometry proves how a novel combination of van der Waals materials is the easy and effective chiral quantum light source of the future.
Applying inhomogeneous strain to chromium oxide thin films induces a strong vertical gradient of the Neel temperature inferred through scanning NV magnetometry measurements.
Scanning NV Magnetometry unveiled for the first time the nanoscale mechanics of antiferromagnetic domain walls opening new avenues for antiferromagnetic spintronics.
Scanning NV Magnetometry unlocks the characterization of the effects of strain and electrical fields on exotic antiferromagnetic spin textures in multiferroics.