The 67th international Symposium of the American Vacuum Society is live this week 25-28 October 2021. As every year, the AVS International Symposium features hundreds of presentations on Emerging Topics Related to Materials, Processing & Interfaces. Take a minute to check out the program here.
Join our Application Scientist Peter Rickhaus for his scientific talk. Peter will show how to exploit scanning NV magnetometry for semiconductor device analysis. Are you curious to know more about this work done in collaboration with one of our industrial partners? Then take a look at the talk here.
Still not registered but looking forward to join Peter’s talk? Then don’t lose the chance and register now through this link.
Where to meet us
Session: Magnetic Interfaces and Nanostructures Division
Talk MI-Contributed On Demand-16: Scanning NV Magnetometry for Semiconductor Device Analysis
Speaker: Peter Rickhaus, Application Scientist at Qnami
Watch Peter’s talk here
Do you want to know more about this novel case study? Drop us an email to email@example.com. Our application scientist Peter will be happy to discuss with you about it.
For any further information, you can visit the Symposium website.