Applying inhomogeneous strain to chromium oxide thin films induces a strong vertical gradient of the Neel temperature inferred through scanning NV magnetometry measurements.
Scanning NV Magnetometry unveiled for the first time the nanoscale mechanics of antiferromagnetic domain walls opening new avenues for antiferromagnetic spintronics.
Scanning NV Magnetometry unlocks the characterization of the effects of strain and electrical fields on exotic antiferromagnetic spin textures in multiferroics.
This technical note explains how spatial resolution is defined in Scanning NV Magnetometry. For a given distance d between the NV center and the scanned surface, the best achievable lateral spatial resolution is 0.86 d.
